QuadTech Inc

The 1750 LCR Digibridge is designed to perform a variety of impedance measurements, with a basic accuracy of 0.1% over a wide frequency range, 20 Hz to 200 kHz. The instrument is capable of measuring primary parameters of inductance (L), capacitance (C), resistance (R), impedance (Z) and secondary parameters of dissipation factor (D), quality factor (Q), resistance (R), and Phase Angle. The 1750 offers a range of features and measurement flexibility making it ideal for applications in product development, incoming inspection, or production line testing.

Description

The 1750 offers a new addition of price/performance within the QuadTech Digibridge family of LCR Meters. This versatile unit provides a wide selection of user programmable capabilities for adapting to the most demanding test requirements.

Seven Impedance Parameters Measures and displays two parameters simultaneously to achieve a wide coverage of components.

Programmable Test Conditions 500 programmable test frequencies between 20 Hz and 200 kHz and programmable test voltage from 10 mV to 2.5 V (in 10mV steps) permits testing at exact specified frequency and voltage. Rapid selection of 43 common test frequencies between 1kHz and 200kHz.

Automatic Ranging The instrument automatically selects one of the seven ranges for optimum instrument accuracy, thus eliminating any chance of operator error when selecting the measurement range.

Load Correction Substantially improves instrument accuracy by allowing the operator to specify the value of the device under test (known standard) and applying the correction to subsequent measurements. Ideal for repetitive testing of identical devices at like test conditions.

Setup Storage and Recall Test conditions for up to 10 test setups can be stored and recalled from internal memory. This, along with front panel lockout helps ensure that test procedures can be run the same way every time.

Open/Short Circuit Zeroing The 1750’s 4-terminal connection automatically measures stray cable parameters and retains the data to correct ongoing measurements thus ensuring measurement integrity to the device under test.

Component Sorting Automatic limit comparison and binning ensure fast, mistake-proof sorting of components. There are 9 pass bins for Go/No Go testing based on a percentage limit around a user programmed nominal value.

Automated Operation IEEE-488 and handler interfaces are standard on the tester, allowing remote control, programming, and datalogging, plus optimized throughput when using a component handler.

• Production testing of LCR Components
• Component Screening
• Material Testing
• Quality Assurance Testing
• Component Design and Evaluation

• Programmable Frequency 20 Hz to 200 KHz
• 0.1% Basic LCR Measurement Accuracy
• Programmable Test Voltage, 10 mV to 2.5 V
• Current Monitoring to Device Under Test
• Auto Ranging
• Test Setup Storage
• Four-Terminal Kelvin Connections
• IEEE-488 and Handler Interfaces
• Component Sorting
• Open/Short Zeroing