QuadTech Inc

The 1930 Capacitance Meter is optimized for high speed and low ESR measurements on tantalum as well as other types of capacitors. Significant engineering effort went into designing the 1930 to out perform other LCR meters when measuring low ESR values at 100kHz. Fast settling time and quick recovery from open or shorted devices can significantly reduce test times especially on capacitors greater than 100uF at 120Hz, thus improving component throughput. Capacitance and impedance measurements can be performed over a frequency range from 100Hz to 100kHz. Emphasis has been placed on ease of use through menu programming and fast accurate production testing via the 1930's remote control capabilities.

• Fast Production Testing of LCR Components and Materials
• Low ESR Measurements on Tantalum and other type Capacitors
• Component Characterization Over a Wide Frequency Range
• Component Screening, Evaluation and Design

• 20 Measurement Parameters
• Frequency Range 100 Hz to 100kHz
• 0.1% Basic Measurement Accuracy
• Measurement Speeds Up to 40/sec
• Repeatable ESR Measurements of better than 0.1% at 1m_
• 50usec/uF Settling Time for 0.1% Accuracy
• 5 Digit Measurement Resolution
• Programmable DC Bias Voltage, 0-2V
• Constant Voltage (Voltage Leveling)
• DC Resistance Measurements
• IEEE-488, RS-232 & Handler Interfaces, all Standard
• Open/Short Zeroing & Cable Compensation
• Load Correction
• 15 Pass/Fail Bins
• Monitoring and Display of DUT Voltage and Current
• Keypad Lockout

20 Measurement Parameters
Measure and display any two of 15 impedance parameters simultaneously, with a basic accuracy of 0.1%. Additionally the 1930 can measure the DC resistance, or display the current through or voltage across a test device ensuring the operator of the real test conditions.

Automatic Test Sequencing
For increased productivity and throughput the 1930 can perform up to six different tests in sequence with a single push of the start button. Each test can have different measurement parameters, test conditions and limits.

Setup Storage/Recall

The test operator has the ability to store and recall, from internal memory, up to 30 single test setups and 10 sequential setups (six tests in sequence). The front panel can be locked out, with password protection, to ensure that procedures are run the same way every time.

Recovers from an open or shorted device in less than 10ms. Settles to 0.1% in 40 to 50us/uF.